Auger Electron Emission Micrography and Microanalysis of Solid Surface

Selective "staining" for Electron Micrography

The physical basis of contrast and image formation in electron micrography is considered in relation to the possibility of recording selective chemical effects on cell components. A technology of selective microchemical analysis, equivalent to differential staining, is suggested as practicable in electron micrography. Electron pictures of bacteria after exposure to salts of heavy metals have sh...

Surface Studied with Auger Electron Spectroscopy

We present an Auger electron spectroscopy (AES) study of the adsorption of nitric oxide (NO) on a dean Si(100)2 × 1 surface at 300 and 550 K. Accurate measurements reveal wall resolved fine structure at Auger Si L2.3 w transitions at 62 and 83 eV. These peaks can be attributed to Si-O and Si-N bonds. Furthermore, it is argued that the broadening in the SiLi2,~W Auger transition at 83 eV at 300 ...

Auger electron emission from fixed-in-space CO.

We have measured the angular distribution of carbon K-Auger electrons from fixed in space, core-ionized, CO molecules in coincidence with the kinetic energy release of the C+ and O+ fragments. We find a very narrow ejection of Auger electrons in the direction of the oxygen and an oscillatory diffraction pattern. Even for similar electron energies, the angular distribution strongly depends on th...

Many-body effects in Auger electron emission from Graphene

The Effects of Surface Roughness on Auger Electron Spectroscopy

The contribution of surface asperities to AES emission yields is discussed in terms of topography analysis. The methods allowing the distribution of heights, slopes, curvatures and other angular functions to be determined are presented here.